is a registered patent attorney who specializes in preparing and prosecuting patent applications. Mr. Hwang is an attorney licensed to practice in Pennsylvania and is registered to practice before the U.S. Patent and Trademark Office.
Prior to joining Van Pelt, Yi & James, Mr. Hwang was a patent examiner for the U.S. Patent and Trademark Office.
Mr. Hwang received his B.S. and M.S. degrees in Electrical Engineering from the University of Delaware. He received his J.D. from Temple University, Beasley School of Law.